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High Temperature Processes in Silicon Solar Cells Production
Frantík, Ondřej ; Hudec, Lubomír (referee) ; Banský,, Juraj (referee) ; Szendiuch, Ivan (advisor)
The thesis is focused on high temperature processes in crystalline solar cells production. Main topic is diffusion of traditional dopants phosphorus and boron. Diffusion processes for creating solar cells are different from classical diffusion in semiconductor industrial. It is reason why the thesis describes crated layers in detail. Knowledge of diffusion processes is used for creating bifacial solar cells and development of a new phosphorus emitter for conventional solar cells. Bifacial cells are a new type of cells. Developed new emitter increases efficiency and decreases cost of solar cells production. Another part the thesis is devoted to the prediction of diffusion processes. New models of phosphorus and boron diffusion for photovoltaic industrial are created in software SILVACO. Models correspond with real results.
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Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element
Pokorný, David ; Šik, Ondřej (referee) ; Polčák, Josef (advisor)
This diploma thesis deals with methodology of thin film thickness determination using X-ray radiation of silver anode which provides radiation with energy of 2984,3 eV. This energy is twice as high as the standard aluminium radiation which allows a measurement of new photoelectron lines with higher bonding energy and it also provides thanks to the higher photoelectron energy greater information depth. In order to get the right results it was necessary to calibrate the spectrometer Kratos Axis Supra in the silver anode mode first and found out the form of the transmission function. The determination of the thickness of the thin layer was demonstrated by the comparation of the ratio of different photoelectron lines intensities with the theoretical model. For that purpose was specifically used the Si 1s and Si 2p peak bound in the substrate in the Si-Si bonding or in the thin oxid layer in the Si-O bonding. The results show that for thin SiO2/Si film thickness determination is the best to use the intensity ratio of only one photoelectron line. A silver anode however provides greater information depth.
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Plasma-enhanced chemical vapor deposition using TVS/Ar and TVS/O2 mixtures
Sadílek, Jakub ; Salyk, Ota (referee) ; Čech, Vladimír (advisor)
Tato studie je zaměřena na základní výzkum přípravy a-SiC:H a a-SiCO:H slitin plazmových polymerů pomocí metody plazmochemické depozice z plynné fáze (PE-CVD). Tyto slitiny byly připravovány depozicí z monomeru tetravinylsilanu (TVS) a jeho směsí s kyslíkem a argonem při různých efektivních výkonech pulzního plazmatu. Připravené tenké vrstvy byly za účelem získání závislostí optických, mechanických a chemických vlastností na depozičních podmínkách zkoumány pomocí metod spektros-kopické elipsometrie (ELL), nanoindentace (NI), fotoelektronové spektrometrie (XPS) a Fourierovy transformované infračervené spektrometrie
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Self-assembled layers based on silicon
Bábík, Adam ; Veselý, Michal (referee) ; Čech, Vladimír (advisor)
Thin film deposition, characterization and properties of self-assembled monolayers based on silicon were studied with emphasis on the SA monolayers deposited from vinyltriethoxysilane and vinyltrichlorsilane. The thesis is aimed at basic properties of the SA monolayer and explanation of its growth. Methods and techniques used for analysis of the monolayer were described as well. Contact angle measurements and an evaluation of the surface free energy are depicted in details. The deposited SA layers were observed with respect to their chemical composition and surface morphology by X-ray photoelectron spectroscopy (XPS), ellipsometry and atomic force microscopy (AFM).
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Study of thin film organic materials thickness
Hegerová, Lucie ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The diploma thesis deals with the determination of thickness and refractive index of thin organic films using image analysis. In the theoretical part there are described principles of the methods, which are used to prepare the films (spin coating, inkjet printing, vapour deposition), the characteristics of thin films, ways of finding out the thickness and refractive index of substances (weight methods, electric methods, method based on measurement of absorption coefficient of light, interference microscopy, ellipsometry) and also image analysis (harmonic and wavelet analysis). Interference microscope Epival - Interpako (Carl Zeiss Jena), digital camera Nikon Coolpix 5400 and computer were used for the determination of thickness and refractive index. The thicknesses of layers were set on the basis of interference images of edges and grooves – both from the side of the metal contact and the side of underlying glass. The refractive indices of thin layers were then set using the recorded figures. In the final part of the thesis there are discussed the results of interference images photographed along the full length of the aluminium contact which are used for measuring electrical characteristics of DPP structures. The produces are thicknesses and refractive indices of individual layers.
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Study of refractive index dispersion dependences with using of interference microscopy
Schmiedová, Veronika ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The master´s thesis deals with the study of optical properties of thin transparent layers on the organic materials (PPV, P3HT, TiO2, DPP) and especially with the determination of dispersion dependences of refractive index of prepared thin layers. In the theoretical part there are described principles of deposition thin layers of the analyzed materials and their properties. In addition, there are also described methods of optical properties measurements (optical and interference microscopy and ellipsometry). The combination of interference microscope with digital camera was used for determination of refractive index. The image analysis was used for the determination of parameters (with help of the software HarFA). The images of thin layers surfaces were analyzed from the side of the metal contact as well as from the side of glass. In conclusion, there are presented results of the refractive index of the thin layers obtained from the measured values.
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Nanolayered Composites
Kontárová, Soňa ; Salyk, Ota (referee) ; Mistrík, Jan (referee) ; Čech, Vladimír (advisor)
Tato studie je zaměřena na základní výzkum tenkých vrstev plazmových polymerů a vliv depozičních podmínek na strukturu a vlastnosti jednotlivých vrstev a multivrstev připravených pomocí metody PE CVD. Jednotlivé vrstvy a multivrstvy a-SiC:H byly deponovány na křemíkové substráty z monomeru tetravinylsilanu (TVS) při různých výkonech v kontinuálním a pulzním režimu. Vrstvy byly rozsáhle zkoumány pomocí spektroskopické elipsometrie, nanoindentace, mikroskopie atomárních sil (AFM), rentgenové fotoelektronové spektroskopie (XPS), spektroskopie Rutherfordova zpětného rozptylu (RBS), rentgenové reflektivity, Fourierovy transformační infračervené spektroskopie (FTIR) a měření kontaktního úhlu, pro zjištění jejich optických, mechanických a chemických vlastností. Byl zkoumán a prokázán vliv depozičních podmínek na fyzikálně-chemické vlastnosti pp-TVS vrstev. Jednotlivé vrstvy byly v rámci po-depoziční úpravy vystaveny UV záření a byl zkoumán účinek stárnutí a vliv UV záření na jejich fyzikální a chemické vlastnosti. Multivrstevnaté struktury (plazmaticky polymerizované 2-vrstvy a 10-ti-vrstvy) s tloušťkou jednotlivých vrstev od 0,5 µm do 25 nm byly úspěšně deponovány a charakterizovány pomocí elipsometrické spektroskopie. Na základě získaných poznatků je možné připravit materiály s vlastnostmi upravenými podle požadavků pro využití v nanokompozitních aplikacích a optických zařízeních.
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Study of optical properties of perovskites and their precursors thin films
Blahut, Jan ; Pospíšil, Jan (referee) ; Zmeškal, Oldřich (advisor)
The thesis is focused on the study of the optical properties of thin films of perovskites and their precursors. The first two chapters of the theoretical part are theoretical introduction to the studied problems, they discuss the basics of electromagnetic radiation and its interaction with matter and basic informations about perovskite materials, especially their semiconductor structure. The remaining two chapters deal with specific principles and practical uses of methods and procedures for the preparation of thin films, as well as the instrumentál characteristics of thin films in terms of their optical properties. The experimental part is focused on the preparation of solutions of perovskites and their precursors, where the replication and optimization of published procedures took place, the preparation of thin layers of these solutions by the spin coating method and their ellipsometric characterization using the Tauc plot method, modeling and fitting of the experimentally determined data, which led to the determination of the index refraction, absorption coefficient and band gap width of individual materials.
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Spectroscopic studies of new generation of optical and magneto-optical materials
Butková, Eva ; Veis, Martin (advisor) ; Chlan, Vojtěch (referee) ; Zemen, Jan (referee)
Title: Spectroscopic studies of new generation of optical and magneto-optical materials Author: Eva Butková Department / Institute: Institute of Physics of Charles University. Department of Materials Science and Technology of Nagaoka University of Technology. Supervisors of the doctoral thesis: RNDr. Martin Veis, Ph.D., Division of Magneto-optics, Institute of Physics of Charles University Dr. Takayuki Ishibashi, Ph.D., Department of Materials Science and Technology, Nagaoka University of Technology Abstract: In recent years, novel optical and magneto-optical devices have been proposed. This ranges from integrated photonic devices such as 3D holographic displays to magnetic recording, non- reciprocal photonic devices such as optical isolators and circulators or high-energy X-ray/gamma ray detectors. These devices, however, require suitable materials with tunable optical and magneto-optical properties. Presented thesis aims to systematically study such materials, namely GdxFe(100-x), magnetic garnets (Y3-xBixFe5O12, Nd2BiFe(5-x)GaxO12, Nd0.5Bi2.5Fe(5-x)GaxO12) and Ce(0.95-x)HfxCo0.05O(2-δ). Systematic study is carried out by the combination of experimental methods of spectroscopic ellipsometry, magneto-optical Kerr effect spectroscopy and Faraday effect spectroscopy. Experimental data are confronted to...
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